| |
Delamere, Alan |
| Volume |
Paper Title |
Page Number |
Authors |
| 8 |
Quantum efficiency measurements of Tektronix backside thinned CCDs |
269 |
Delamere, Alan; Atkinson, Mike; Rice, James P.; Blouke, Morley; Reed, Richard |
| 8 |
Radiation test results on TK 1024 CCDs |
275 |
Delamere, Alan; Murata-Seawalt, Debbie; Orbock, Jeff; Blouke, Morley; Fowler, Walt; Rebar, Frank |
|
|
