|
|
Paper: |
Measuring Uncertainties in the Hinode X-Ray Telescope |
Volume: |
456, The Fifth Hinode Science Meeting |
Page: |
241 |
Authors: |
Kobelski, A.; Saar, S.; McKenzie, D. E.; Weber, M.; Reeves, K.; DeLuca, E. |
Abstract: |
We have developed estimates of the systematic photometric uncertainties the X-Ray
Telescope (Kano et al. (2008)) on Hinode (Kosugi et al.(2007)). These estimates are
included as optional returns from the standard XRT data reduction software, xrt_prep.pro. Included
in the software estimates are uncertainties from instrument vignetting, dark current subtraction, split
bias leveling, fourier filtering and JPEG compression. We show that these uncertainties are
generally smaller than the photon counting uncertainty. However, due to the reliance on
assumptions of plasma radiation models and elemental abundances, photon counting is not
included in the software. |
|
|
|
|