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Erwin, P. |
Volume |
Paper Title |
Page Number |
Authors |
230 |
Kinematics and Photometry as Complementary Tools in the Study of Barred Galaxies |
245 |
Vega Beltrán, J. C.; Erwin, P.; Beckman, J. E.; Pizzella, A.; Corsini, E. M.; Bertola, F.; Zeilinger, W. W. |
275 |
A Correlation between Supermassive Black Hole Mass and Galaxy Light Concentration |
87 |
Graham, A. W.; Erwin, P.; Caon, N.; Trujillo, I. |
275 |
Double Bars and Inner Disks in Barred Galaxies |
271 |
Erwin, P. |
390 |
Three Types of Galaxy Disks |
247 |
Pohlen, M.; Erwin, P.; Trujillo, I.; Beckman, J.E. |
390 |
The Outer Structure of Galactic Disks: Connections Between Bars, Disks, and Environments |
251 |
Erwin, P.; Pohlen, M.; Beckman, J.E.; Gutiérrez, L.; Aladro, R. |
390 |
Classification of Galaxies by Their Radial Profiles: Unbarred Early Types |
288 |
Aladro, R.; Gutiérrez, L.; Erwin, P.; Beckman, J.E. |
396 |
The Good, the Bad, and the Ugly: Three Types of Disks |
183 |
Pohlen, M.; Beckman, J.E.; Aladro, R.; Dettmar, R.-J.; Erwin, P.; Gutiérrez, L.; Peletier, R.F.; Trujillo, I.; Zaroubi, S. |
396 |
Extended UV (XUV) Emission in Nearby Galaxy Disks |
197 |
Gil de Paz, A.; Thilker, D.A.; Bianchi, L.; Aragón-Salamanca, A.; Boissier, S.; Madore, B.F.; Díaz-López, C.; Trujillo, I.; Pohlen, M.; Erwin, P.; Zamorano, J.; Gallego, J.; Iglesias-Páramo, J.; Vílchez, J.M.; Mollá, M.; Muñoz-Mateos, J.C.; Pérez-González, P.G.; Pedraz, S.; Sheth, K.; Kennicutt, R.C.; Swaters, R.A.; the GALEX Science Team |
396 |
Trends for Outer Disk Profiles |
207 |
Erwin, P.; Pohlen, M.; Gutiérrez, L.; Beckman, J.E. |
432 |
Barred Galaxies in the Coma Cluster |
219 |
Marinova, I.; Jogee, S.; Trentham, N.; Ferguson, H. C.; Weinzirl, T.; Balcells, M.; Carter, D.; den Brok, M.; Erwin, P.; Graham, A. W.; Goudfrooij, P.; Guzmán, R.; Hammer, D.; Hoyos, C.; Peletier, R. F.; Peng, E.; Kleijn, G. V. |
480 |
Hα Surface Brightness Profiles of Star-Forming Galaxies and Dependence on Halo Mass Using the HAGGIS Survey |
255 |
Kulkarni, S.; Wilman, D.; Erwin, P.; Koppenhöfer, J.; Gutierrez, L.; Beckman, J.; Saglia, R.; Bender, R. |
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